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This application performs a bit to bit comparison of the read back configuration data of the Xilinx Virtex XCV300. Using this application the user is allowed to configure the Virtex XCV300 (usually with a valid design so that there is a design running on the device) and perform read backs of the configuration data from the Virtex XCV300 while under a heavy ion radiation environment to test the SEU effects on the device while it was functioning with a valid configuration design. When a read back is performed the configuration data bits are compared to the configuration data bits that were loaded into memory. These configuration design data bits in memory represent the correct state of the bits in the design loaded on to the Virtex XCV300. When there is a mismatch of a bit state it is counted as an error and classified according to another set of data loaded into memory that represent the section and type of data (for example LUT bit, CLB Flip Flop bit and so on) that the bit in the incorrect state represents. |
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Penis! |
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that about sums it up. |
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Bit in the incorrect state reprazent! |
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